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TECHNICAL ISO/TR
REPORT 19733
First edition
2019-03
Nanotechnologies — Matrix of
properties and measurement
techniques for graphene and related
two-dimensional (2D) materials
Nanotechnologies — Matrice des propriétés et des techniques de
mesure pour le graphène et autres matériaux bidimensionnels (2D)
Reference number
ISO/TR 19733:2019(E)
©
ISO 2019
ISO/TR 19733:2019(E)
© ISO 2019
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Published in Switzerland
ii © ISO 2019 – All rights reserved
ISO/TR 19733:2019(E)
Contents Page
Foreword .v
Introduction .vi
1 Scope . 1
2 Normative references . 1
3 Terms and definitions, symbols and abbreviated terms . 1
3.1 Terms and definitions . 1
3.2 Symbols and abbreviated terms. 2
4 Matrix of properties and measurement techniques for graphene and related 2D
materials . 3
5 Properties and measurands . 4
5.1 Structural properties . 4
5.1.1 Crystal defect. 4
5.1.2 Domain (grain) size . 5
5.1.3 Flake size . 6
5.1.4 Number of layers . 6
5.1.5 Stacking angle . 6
5.1.6 Surface area . 6
5.1.7 Thickness . 6
5.2 Chemical properties . 6
5.2.1 Metal contents . 6
5.2.2 Non-graphene contents and residue . 7
5.2.3 Oxygen content . 7
5.3 Mechanical properties, elastic modulus . 7
5.4 Thermal properties, thermal conductivity . 7
5.5 Optical properties, optical transmittance . 7
5.6 Electrical and electronic properties . 7
5.6.1 Charge carrier concentration (density) . 7
5.6.2 Charge carrier mobility . 8
5.6.3 Sheet resistance . 8
5.6.4 Work function . 8
6 Measurement techniques . 8
6.1 Atomic force microscopy (AFM) . 8
6.2 Brunauer, Emmett and Teller method (BET) . 9
6.3 Combustion analysis . 9
6.4 Electron probe X-ray microanalysis (EPMA) . 9
6.5 Electron spin resonance (ESR) .10
6.6 Fourier transform- infrared spectroscopy (FT-IR) .10
6.7 Hall bar measurement .10
6.8 Inductively coupled plasma — Mass spectrometry (ICP-MS) .11
6.9 Kelvin probe force microscopy (KPFM) .11
6.10 Low energy electron microscopy (LEEM) .12
6.11 Optical microscopy .12
6.12 Raman spectroscopy .12
6.13 Scanning electron microscopy (SEM) .13
6.14 Secondary-ion mass spectrometry (SIMS) .13
6.15 Scanning tunnelling microscopy (STM) .13
6.16 Transmission electron microscopy (TEM) .13
6.17 Thermogravimetric analysis (TGA) .14
6.18 Titration .14
6.19 Ultraviolet photoelectron microscopy (UPS) .14
6.20 Ultraviolet, visible, near-infrared (UV-VIS-NIR) spectroscopy .14
6.21 X-ray diffraction (XRD) .15
ISO/TR 19733:2019(E)
6.22 X-ray photoelectron spectroscopy (XPS) .15
6.23 4-point probe .15
Bibliography .16
iv © ISO 2019 – All rights reserved
ISO/TR 19733:2019(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to the
World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT) see www .iso
.org/iso/foreword .html.
This document was prepared jointly by Technical Committee ISO/TC 229, Nanotechnologies and
Technical Committee IEC/TC 113, Nanotechnology for electrotechnical products and systems. The draft
was circulated for voting to the national bodies of both ISO and IEC.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/members .html.
ISO/TR 19733:2019(E)
Introduction
Graphene is a single layer of carbon atoms with each atom bound to three neighbours in a honeycomb
[1] [2]
structure . Since its discovery in 2004 , graphene has become one of the most attractive materials
in application research and device industry due to its supreme material properties such as mechanical
strength, stiffness and elasticity, high electrical and thermal conductivity, optical transparency, etc. It is
expected that applications of graphene could replace many of current device development technology in
flexible touch panel, organic light emitting diode (OLED), solar cell, supercapacitor, and electromagnetic
shielding. To gain deeper understanding of the material properties and to find the ways of mass
producing with fine quality, much research on graphene, and similarly on related two-dimensional
(2D) materials is being done in universities, research institutes, and laboratories around the globe.
However, to lead these revolutionary materials to full commercialization, it is essentially demanded
that characterization and me
...