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IEC 61000-4-25
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 2
AM ENDEMENT 2
Electromagnetic compatibility (EMC) –
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems
Compatibilité électromagnétique (CEM) –
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes
IEC 61000-4-25:2001-11/AMD2:2019-12(en-fr)
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IEC 61000-4-25
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 2
AM ENDEMENT 2
Electromagnetic compatibility (EMC) –
Part 4-25: Testing and measurement techniques – HEMP immunity test methods
for equipment and systems
Compatibilité électromagnétique (CEM) –
Partie 4-25: Techniques d’essai et de mesure – Méthodes d’essai d’immunité à
l’IEMN-HA des appareils et des systèmes
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.99 ISBN 978-2-8322-7688-4
– 2 – IEC 61000-4-25:2001/AMD2:2019
© IEC 2019
FOREWORD
This amendment has been prepared by subcommittee 77C: High power transient phenomena, of
IEC technical committee 77: Electromagnetic compatibility.
The text of this amendment is based on the following documents:
CDV Report on voting
77C/285/CDV 77C/290/RVC
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC web site under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication
will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
5.4.3 Small radiated test facilities
Replace the existing text with the following new text:
Small test facilities can more easily meet the desired field specifications with smaller tolerances
in parameter variations than the large HEMP simulators. These small facilities will be used
primarily to test relatively small equipment. Tolerances for the early-time HEMP pulse waveform
over the entire parallelepiped test volume of the small test facility shall be as follows.
– The ratio of the peak electric field to the peak magnetic field shall be equal to 377 Ω with a
tolerance of ±75 Ω.
– The rise time between 10 % and 90 % of the peak value shall be 2,5 ns with a tolerance of ±
0,5 ns.
– The electric field shall be continuously increasing during the 10 % and 90 % rise time.
– The pulse width (the time duration between points on the leading and trailing edges of the
pulse at 50 % of E ) shall be 23 ns with a tolerance of ±5 ns.
peak
– The magnitude of any pre-pulse on the electric field shall be equal to or less than 7 % of the
magnitude of the peak field.
– Electric field reflections from the terminator of the simulator shall be less than 10 %.
– Fluctuations in the smoothed frequency spectrum of the electric field at the centre of the test
volume (see 5.4.5) shall not be larger than ±3 dB compared to the theoretical spectrum given
by equation (2) in the bandwidth between 100 kHz and 300 MHz.
© IEC 2019
– At the time of the peak value of the simulated fields, other non-principal electromagnetic
components shall be smaller than 10 % of the peak value of the simulated field.
– The peak electric field shall be uniform in the test volume to within the following criteria: the
peak electric field within the test volume shall be within the range of E and E + 6 dB.
peak peak
– To evaluate the field tolerances, electric and magnetic field measurements at the centre and
eight corners of the test volume shall be performed in the absence of the EUT.
5.4.4.1 Large HEMP simulators − type I
Replace the existing text with the following new text:
For testing in the type I simulators, the peak electric field, (E ) shall be chosen from Table 1
peak
corresponding to the immunity
...