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IEC 61788-7
Edition 3.0 2020-03
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
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IEC 61788-7
Edition 3.0 2020-03
REDLINE VERSION
INTERNATIONAL
STANDARD
colour
inside
Superconductivity –
Part 7: Electronic characteristic measurements – Surface resistance of
high‑temperature superconductors at microwave frequencies
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.220.20; 29.050 ISBN 978-2-8322-7917-5
– 2 – IEC 61788-7:2020 RLV © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Requirements . 9
5 Apparatus . 9
5.1 Measurement system . 9
5.2 Measurement apparatus for R . 10
s
5.3 Dielectric rods . 12
6 Measurement procedure . 13
6.1 Specimen preparation . 13
6.2 Set-up . 13
6.3 Measurement of reference level . 14
6.4 Measurement of the frequency response of resonators . 14
6.5 Determination of surface resistance of the superconductor and ε′ and tan δ
of the standard sapphire rods. 16
7 Precision and accuracy Uncertainty of the test method . 17
7.1 Surface resistance . 17
7.2 Temperature . 18
7.3 Specimen and holder support structure . 19
7.4 Specimen protection . 19
7.5 Uncertainty of surface resistance measured by standard two-resonator
method . 19
8 Test report . 19
8.1 Identification of test specimen . 19
8.2 Report of R values . 19
s
8.3 Report of test conditions . 20
Annex A (informative) Additional information relating to Clauses 1 to 8 . 21
A.1 Scope . 21
A.1.1 General . 21
A.1.2 Cylindrical cavity method [10] [17] . 21
A.1.3 Parallel-plates resonator method [18] [19] . 21
A.1.4 Microstrip-line resonance method [20] [21] . 21
A.1.5 Dielectric resonator method [22] [23] [24] [25] . 21
A.1.6 Image-type dielectric resonator method [26] [27] . 22
A.1.7 Two-resonator method [28] [29] . 23
A.2 Requirements . 23
A.3 Theory and calculation equations . 23
A.4 Apparatus . 27
A.5 Dimensions of the standard sapphire rods . 27
A.6 Dimension of the closed type resonator . 29
A.7 Precision and accuracy of the test method .
A.7 Sapphire rod reproducibility . 31
A.8 Test results . 32
A.9 Reproducibility of measurement method . 32
A.10 tan δ deviation effect of sapphire rods on surface resistance . 33
Annex B (informative) Evaluation of relative combined standard uncertainty for surface
resistance measurement . 36
B.1 Practical surface resistance measurement . 36
B.2 Determination of surface resistance of the superconductor . 37
B.3 Combined standard uncertainty . 38
B.3.1 General . 38
B.3.2 Calculation of c to c (12 GHz resonance at 20 K) . 38
2 5
B.3.3 Determination of u to u . 39
1 5
B.3.4 Combined relative standard uncertainty . 41
Bibliography . 43
Figure 1 – Schematic diagram of measurement system for temperature dependence of
R using a cryocooler . 10
s
Figure 2 – Typical measurement apparatus for R . 11
s
Figure 3 – Insertion attenuation, IA, resonant frequency, f , and half power bandwidth,
∆f, measured at T kelvin . 14
Figure 4 – Reflection scattering parameters (S and S ) . 16
11 22
Figure 5 – Term definitions in Table 4 . 18
Figure A.1 – Schematic configuration of several measurement methods for the surface
resistance . 22
Figure A.2 – Configuration of a cylindrical dielectric rod resonator short-circuited at
both ends by two parallel superconductor films deposited on dielectric substrates . 24
Figure A.3 – Computed results of the u-v and W-v relations for TE mode . 25
01p
Figure A.4 – Configuration of standard dielectric rods for measurement of R and tan δ . 26
s
Figure A.5 – Three types of dielectric resonators . 27
Figure A.6 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [28] . 28
Figure A.7 – Mode chart to design TE resonator short-circuited at both ends by
parallel superconductor films [28] . 29
Figure A.8 – Mode chart for TE closed-type resonator [28] . 30
Figure A.9 – Mode chart for TE closed-type resonator [28] . 31
Figure A.10 – Temperature-dependent R of YBCO film with a thickness of 500 nm
s
and size of 25 mm square . 32
Figure A.11 – Temperature dependent R of YBCO film when R was measured three
s s
times. 33
Figure B.1 – Schematic diagram of TE and TE mode resonance . 36
011 013
Figure B.2 – Typical frequency characteristics of TE mode resonance . 37
Figure B.3 – Frequency characteristics of a resonator approximated by a Lorentz
distribution . 41
Table 1 – Typical dimensions of pairs of standard single-crystal sapphire rods for
12 GHz, 18 GHz and 22 GHz . 12
Table 2 – Dimensions of superconductor film for 12 GHz, 18 GHz, and 22 GHz . 13
– 4 – IEC 61788-7:2020 RLV © IEC 2020
Table 3 – Specifications for vector network analyzer . 17
Table 4 – Specifications for sapphire rods . 18
Table A.1 – Standard deviation of the surface resistance calculated from the results of
Figure A.11 . 33
Table A.2 – Relationship between x, defined by Equation (A.12), and y, defined by
Equation (A.13) . 34
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SUPERCONDUCTIVITY –
Part 7: Electronic characteristic measurements –
Surface resistance of high-temperature
superconductors at microwave frequencies
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardiz
...