IEC 61000-4-36:2020

Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems

IEC 61000-4-36:2020

Name:IEC 61000-4-36:2020   Standard name:Electromagnetic compatibility (EMC) - Part 4-36: Testing and measurement techniques - IEMI immunity test methods for equipment and systems
Standard number:IEC 61000-4-36:2020   language:English language
Release Date:22-Mar-2020   technical committee:SC 77C - High power transient phenomena
Drafting committee:MT 61000-4-36 - TC 77/SC 77C/MT 61000-4-36   ICS number:01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION

IEC 61000-4-36
Edition 2.0 2020-03
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –
Part 4-36: Testing and measurement techniques – IEMI immunity test methods
for equipment and systems




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IEC 61000-4-36
Edition 2.0 2020-03
INTERNATIONAL
STANDARD
colour
inside
BASIC EMC PUBLICATION
Electromagnetic compatibility (EMC) –

Part 4-36: Testing and measurement techniques – IEMI immunity test methods

for equipment and systems
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.100.20 ISBN 978-2-8322-7942-7

– 2 – IEC 61000-4-36:2020 © IEC 2020
CONTENTS
FOREWORD . 7
INTRODUCTION . 9
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 10
3.1 Terms and definitions . 10
3.2 Abbreviated terms . 14
4 General . 15
5 IEMI environments and interaction . 16
5.1 General . 16
5.2 IEMI environments . 17
5.2.1 Technical capability groups . 17
5.2.2 IEMI deployment scenarios . 17
5.2.3 Radiated IEMI environment summary . 17
5.2.4 Published conducted IEMI environments. 18
5.3 Interaction with victim equipment, systems and installations . 18
5.3.1 General . 18
5.3.2 Protection level . 19
6 Test methods . 20
6.1 Derivation of applicable test methods . 20
6.2 Derivation of transfer functions . 21
6.3 Radiated tests using IEMI simulator . 22
6.4 Radiated tests using a reverberation chamber . 22
6.5 Complex waveform injection (CWI) . 22
6.6 Damped sinusoidal injection (DSI) . 22
6.7 Electrostatic discharge (ESD) . 22
6.8 Electrically fast transient (EFT) . 22
6.9 Antenna port injection . 23
7 Test parameters . 23
7.1 Derivation of immunity test parameters . 23
7.2 Radiated test parameters . 23
7.2.1 Generic hyperband test parameters (skilled capability group) . 23
7.2.2 Generic mesoband test parameters (skilled capability group). 25
7.2.3 Generic hypoband test parameters (skilled capability group) . 27
7.3 Generic conducted IEMI test parameters. 28
7.3.1 General . 28
7.3.2 Characteristics and performance of the fast damped oscillatory wave
generator . 29
7.4 Tailored test level derivation . 30
7.5 Relevance of EMC immunity data . 30
Annex A (informative) Failure mechanisms and performance criteria . 31
A.1 General . 31
A.2 Failure mechanisms . 31
A.2.1 General . 31
A.2.2 Noise . 32

A.2.3 Parameter offset and drifts . 32
A.2.4 System upset or breakdown . 33
A.2.5 Component destruction . 33
A.3 Effect of pulse width. 34
A.4 Performance criteria . 34
A.5 References . 35
Annex B (informative) Developments in IEMI source environments . 37
B.1 General . 37
B.2 IEMI environment . 38
B.3 IEMI sources . 39
B.4 Published radiated IEMI environments . 43
B.4.1 IEC 61000-2-13 [B.14] . 43
B.4.2 Mil-Std-464C . 43
B.4.3 Selection of parameters for mesoband immunity test . 45
B.4.4 International Telecommunication Union (ITU) . 47
B.5 Summary . 47
B.6 References . 48
Annex C (informative) Interaction with buildings . 50
C.1 Building attenuation . 50
C.2 Coupling to cables . 51
C.3 Low voltage cable attenuation . 52
C.4 References . 53
Annex D (informative) Relation between plane wave immunity testing and immunity
testing in a reverberation chamber . 55
D.1 General . 55
D.2 Relation between measurements of shielding effectiveness in the two
environments . 56
D.3 Relation between immunity testing in the two environments . 59
D.4 Additional aspects . 61
D.5 References . 61
Annex E (informative) Complex waveform injection – Test method . 64
E.1 General . 64
E.2 Prediction . 64
E.2.1 General . 64
E.2.2 Example . 68
E.3 Construction . 70
E.4 Injection . 74
E.5 Summary . 76
E.6 References . 76
Annex F (informative) Significance of test methodology margins . 78
F.1 General . 78
F.2 Examples . 78
F.2.1 General . 78
F.2.2 Negative contributions . 79
F.2.3 Positive contributions. 81
F.2.4 Summary . 83
F.3 References . 83
Annex G (informative) Intentional EMI – The issue of jammers . 84
G.1 General . 84

– 4 – IEC 61000-4-36:2020 © IEC 2020
G.2 Effects .
...

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