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IEC TR 62396-8
Edition 1.0 2020-04
TECHNICAL
REPORT
colourcolour
insinsiidede
Process management for avionics – Atmospheric radiation effects –
Part 8: Proton, electron, pion, muon, alpha-ray fluxes and single event effects
in avionics electronic equipment – Awareness guidelines
your local IEC member National Committee for further information.
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IEC TR 62396-8
Edition 1.0 2020-04
TECHNICAL
REPORT
colourcolour
insinsiidede
Process management for avionics – Atmospheric radiation effects –
Part 8: Proton, electron, pion, muon, alpha-ray fluxes and single event effects
in avionics electronic equipment – Awareness guidelines
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 03.100.50; 31.020; 49.060 ISBN 978-2-8322-8010-2
– 2 – IEC TR 62396-8:2020 © IEC 2020
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 8
2 Normative references . 8
3 Terms, definitions, abbreviated terms and acronyms . 8
3.1 Terms and definitions . 9
3.2 Abbreviated terms and acronyms . 10
4 Technical awareness . 12
4.1 Basic knowledge of atmospheric secondary particles . 12
4.2 Four typical hierarchies of faulty conditions in electronic equipment: Fault –
error – hazard – failure . 15
4.3 General sources of radiation . 18
4.3.1 General sources of terrestrial radiation . 18
4.3.2 Atmospheric radiation particles . 19
4.3.3 Spectra at the avionics altitude . 22
4.4 Particle considerations . 25
4.4.1 General . 25
4.4.2 Alpha particles . 25
4.4.3 Protons . 26
4.4.4 Muons and pions . 30
4.4.5 Low-energy neutrons . 32
4.4.6 High-energy neutrons . 33
4.5 Conclusion and guidelines . 43
Annex A (informative) CMOS semiconductor devices . 45
Annex B (informative) General description of radiation effects . 48
B.1 Radiation effects in semiconductor materials by a charged particle – Charge
collection and bipolar action . 48
B.2 Radiation effects by protons . 49
B.3 Radiation effects by low-energy neutrons . 51
B.4 Radiation effects by high-energy neutrons . 52
B.5 Radiation effects by heavy ions . 53
Bibliography . 54
Figure 1 – Cosmic rays as origin of single event effects . 13
Figure 2 – Initial stage of secondary particle production . 14
Figure 3 – Differential high-energy neutron spectrum at sea level in NYC . 14
Figure 4 – Long-term cyclic variation in neutron flux measured at Moscow Neutron
Monitor Center . 15
Figure 5 – Differential proton spectra originating from solar-minimum sun, from big
flares on the sun, and from the galactic core . 15
Figure 6 – Typical hierarchy of fault conditions: Fault-error-failure . 18
Figure 7 – Sources of atmospheric ionizing radiation: Nuclear reactions and radioactive
decay . 19
Figure 8 – Differential flux of secondary cosmic rays at avionics altitude (10 000 m)
above NYC sea level . 22
Figure 9 – Differential flux of terrestrial radiation at NYC sea level . 23
Figure 10 – Measured differential flux of high-energy neutrons at NYC sea level and at
avionics altitudes (5 000 m, 11 000 m and 20 000 m) . 24
Figure 11 – Cumulative flux of terrestrial radiation at avionics altitude above NYC sea
level 25
Figure 12 – Comparison of measured cross section of memory devices irradiated by
high-energy protons and neutrons . 27
Figure 13 – Simplified scheme of muon/pion irradiation system . 30
Figure 14 – Nuclear capture of cross section of cadmium isotopes . 32
Figure 15 – Neutron energy spectra of monoenergetic neutron beam facilities . 35
Figure 16 – Neutron energy spectra from radioisotope neutron sources . 35
Figure 17 – Simplified high-energy neutron beam source in a quasi-monoenergetic
neutron source . 37
Figure 18 – Neutron energy spectra of quasi-monoenergetic neutron beam facilities . 38
Figure 19 – Conceptual illustration of cross section data obtained by (quasi-)
monoenergetic neutron sources and fitting curve by Weibull fit . 39
Figure 20 – Simplified high-energy neutron beam source in a spallation neutron source . 41
Figure 21 – Neutron energy spectra of spallation neutron sources and terrestrial field . 42
Figure A.1 – Basic substrate structure used for CMOSFET devices on the stripe
structure of p- and n-wells and cross sections of triple and dual wells . 45
Figure A.2 – SRAM function and layout . 46
Figure A.3 – Example of logic circuit . 46
Figure A.4 – Example of electronic system implementation . 47
Figure A.5 – Example of stack layers in an electronic system . 47
Figure B.1 – Charge collection in a semiconductor structure by funnelling . 48
Figure B.2 – Bipolar action model in a triple well n-MOSFET structure . 49
Figure B.3 – Charge deposition density of various particles in silicon as a function of
particle energy . 50
Figure B.4 – Total nuclear reaction cross section of high-energy proton and neutron in
silicon . 50
Figure B.5 – Microscopic fault mechanism due to spallation reaction of high-energy
neutron and proton in a SRAM cell . 51
Figure B.6 – (n,α) reaction cross section of low-energy neutrons with B . 52
Figure B.7 – Calculated energy spectra of Li and He produced by neutron capture
10 7
reaction with B(n,α) Li reaction . 52
Figure B.8 – Ranges of typical isotopes produced by nuclear spallation reaction of
high-energy neutron in silicon . 53
Figure B.9 – Calculated energy spectra of elements produced by nuclear spallation
reaction of high-energy neutrons in silicon at Tokyo sea level . 53
Table 1 – General modes of faults . 17
Table 2 – Properties of atmospheric radiation particles . 19
Table 3 – Selected data sources for spectra of atmospheric radiation particles . 22
Table 4 – Non-exhaustive list of methods for alpha-particle SEE measurements . 26
Table 5 – Non-exhaustive list of facilities for proton irradiation . 27
Table 6 – Non-exhaustive list of facilities for muon irradiation . 31
Table 7 – Non-exhaustive list of facilities for thermal/epi-thermal neutron irradiation . 33
– 4 – IEC TR 62396-8:2020 © IEC 2020
Table 8 – Non-exhaustive list of facilities for low-energy neutron irradiation . 36
Table 9 – Non-exhaustive list of facilities for quasi-monoenergetic neutron irradiation . 40
Table 10 – Non-exhaustive list of facilities for nuclear spallation neutron irradiation . 42
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PROCESS MANAGEMENT FOR AVIONICS –
ATMOSPHERIC RADIATION EFFECTS –
Part 8: Proton, electron, pion, muon, alpha-ray fluxes and single event
effects in avionics electronic equipment – Awareness guidelines
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Pub
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