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IEC 62153-4-10
Edition 2.0 2020-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Metallic communication cable test methods –
Part 4-10: Electromagnetic compatibility (EMC) – Transfer impedance and
screening attenuation of feed-throughs and electromagnetic gaskets – Double
coaxial test method
Méthodes d’essai des câbles métalliques de communication –
Partie 4-10: Compatibilité électromagnétique (CEM) – Impédance de transfert et
affaiblissement d'écran des traversées et des joints d’étanchéité
électromagnétiques – Méthode d'essai coaxiale double
IEC 62153-4-10:2015-11/AMD1:2020-07(en-fr)
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IEC 62153-4-10
Edition 2.0 2020-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Metallic communication cable test methods –
Part 4-10: Electromagnetic compatibility (EMC) – Transfer impedance and
screening attenuation of feed-throughs and electromagnetic gaskets – Double
coaxial test method
Méthodes d’essai des câbles métalliques de communication –
Partie 4-10: Compatibilité électromagnétique (CEM) – Impédance de transfert et
affaiblissement d'écran des traversées et des joints d’étanchéité
électromagnétiques – Méthode d'essai coaxiale double
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.100.10; 33.120.10 ISBN 978-2-8322-8557-2
– 2 – IEC 62153-4-10:2015/AMD1:2020
© IEC 2020
FOREWORD
This amendment has been prepared by IEC technical committee 46: Cables, wires,
waveguides, RF connectors, RF and microwave passive components and accessories.
The text of this amendment is based on the following documents:
CDV Report on voting
46/736/CDV 46/769/RVC
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of this amendment and the base publication will
remain unchanged until the stability date indicated on the IEC website under
"http://webstore.iec.ch" in the data related to the specific publication. At this date, the
publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
_____________
Add, after Annex C, the following new Annex D (informative):
Annexe D
(informative)
Measurement of the transfer impedance of conductive
gaskets with controlled contact pressure
D.1 General
A well-known effect in contact physics is the dependence of the contact resistance to the
force F that is applied to the contact system. A typical progression of the contact resistance
−2/3
follows ~F meaning that if the contact force is increased, the contact resistance is
decreasing based on an increasing number of microscopic contact points. Conductive gaskets
act in a similar manner. When the pressure acting on the gasket is increased, the resistance
of the transition through the arrangement contact surface 1 – gasket – contact surface 2 is
decreasing.
This annex gives the normative details whenever pressure controlled measurements of the
transfer impedance of conductive gaskets are required.
© IEC 2020
D.2 Measuring equipment and auxiliary measuring devices
Typical measuring equipment and auxiliary measuring devices consist of:
• RF-generator and test receiver (test method A) or a network analyser (NWA) (test
method B,
• test fixture for the relevant specimen size,
• terminating resistor (test method A: RF-generator and test receiver).
D.3 Test setup
The test set-up is shown in Figure D.1.
Figure D.1 – Test set-up
Figure D.2 shows the details of an example for a suitable test fixture enabling the
determination of certain contact pressures during the measurement.
– 4 – IEC 62153-4-10:2015/AMD1:2020
© IEC 2020
Key
1 termination (only required for test method A: RF-Generator and test receiver)
2 housing lid
3 test specimen
4 connection to generator port (method A) or NWA Port 1 (method B)
5 contact element
6 insulator
7 housing
8 pressure element
9 connection to test receiver port (method A) or NWA Port 2 (method B)
10 connection to pneumatic or hydraulic
11 manometer
Figure D.2 – Details of the test fixture
D.4 Test specimen
Specimens of size A are dimensioned for measurements up to 3 GHz, size B f
...