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IEC 62435-7
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electronic components – Long-term storage of electronic semiconductor
devices –
Part 7: Micro-electromechanical devices
Composants électroniques – Stockage de longue durée des dispositifs
électroniques à semiconducteurs –
Partie 7: Dispositifs microélectromécaniques
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IEC 62435-7
Edition 1.0 2020-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Electronic components – Long-term storage of electronic semiconductor
devices –
Part 7: Micro-electromechanical devices
Composants électroniques – Stockage de longue durée des dispositifs
électroniques à semiconducteurs –
Partie 7: Dispositifs microélectromécaniques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.020 ISBN 978-2-8322-9147-4
– 2 – IEC 62435-7:2020 © IEC 2020
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Storage considerations . 9
4.1 Overview of MEMS applications . 9
4.2 Failure mechanisms . 9
4.2.1 Occurrence of failure and driving force . 9
4.2.2 Storage environment and mitigation for stimuli to prevent failure . 12
4.3 Materials management . 13
4.4 Storage media . 13
4.5 Documentation/paper lot identifiers . 14
4.6 Inventory check. 14
4.7 Inventory dry packing refreshing . 14
4.8 Inventory re-assessment . 14
5 Baseline long-term storage requirements . 14
5.1 General . 14
5.2 Moisture sensitivity designation . 15
5.3 Dry packing for storage . 15
5.4 Non-moisture sensitive device storage . 15
5.4.1 General . 15
5.4.2 Storage media . 15
5.4.3 Lot data and labelling . 15
5.5 Storage of MEMS devices before assembly – Wafer level and die level
storage . 15
5.6 Storage of moisture sensitive finished devices . 15
5.6.1 Moisture barrier bag . 15
5.6.2 Dunnage . 16
5.6.3 Humidity indicator card . 16
5.6.4 Desiccant . 16
5.6.5 Labelling . 16
5.6.6 Lot data and labelling . 16
5.6.7 Storage environment . 17
5.6.8 Process (temperature) sensitivity designation . 17
Annex A (informative) Packaged or finished device storage environment
considerations . 18
Bibliography . 19
Table 1 – Failure mechanisms in storage and stimuli to mitigate during storage . 10
Table 2 – Long-term environment – sustained condition requirements . 13
Table 3 – Considerations for management, control and documentation during storage . 13
Table A.1 – Long-term storage environment – sustained condition considerations . 18
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRONIC COMPONENTS – LONG-TERM STORAGE
OF ELECTRONIC SEMICONDUCTOR DEVICES –
Part 7: Micro-electromechanical devices
FOREWORD
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IEC 62435-7 has been prepared by IEC technical committee 47: Semiconductor devices. It is
an International Standard.
The text of this International Standard is based on the following documents:
Draft R
...