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IEC 62228-5
Edition 1.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 5: Ethernet transceivers
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IEC 62228-5
Edition 1.0 2021-04
INTERNATIONAL
STANDARD
colour
inside
Integrated circuits – EMC evaluation of transceivers –
Part 5: Ethernet transceivers
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.200 ISBN 978-2-8322-9697-4
– 2 – IEC 62228-5:2021 © IEC 2021
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms, definitions and abbreviated terms . 11
3.1 Terms and definitions . 11
3.2 Abbreviated terms . 12
4 General . 13
5 Test and operating conditions . 14
5.1 Supply and ambient conditions. 14
5.2 Test operation modes . 14
5.2.1 General . 14
5.2.2 Transceiver configuration for normal operation mode . 15
5.2.3 Transceiver configuration for low power mode . 15
5.3 Definition of BIN . 15
5.4 Test configuration . 16
5.4.1 General configuration for transceiver network . 16
5.4.2 General configuration for single transceiver . 18
5.4.3 Transceiver network tests – coupling ports and networks for conducted
tests . 18
5.4.4 Single transceiver tests – coupling ports and networks . 21
5.5 Test communication and signals . 22
5.5.1 General . 22
5.5.2 Test signals for normal operation mode . 22
5.5.3 Test signals for low power mode . 23
5.6 Evaluation criteria . 23
5.6.1 General . 23
5.6.2 Evaluation criteria for functional operation modes . 23
5.6.3 Evaluation criteria in unpowered condition after exposure to
disturbances . 24
5.6.4 Status classes . 25
5.7 DUT specific information . 26
6 Test and measurement . 26
6.1 Emission of conducted RF disturbances . 26
6.1.1 Test method . 26
6.1.2 Test setup . 26
6.1.3 Test procedure and parameters . 27
6.2 Immunity to conducted RF disturbances . 28
6.2.1 Test method . 28
6.2.2 Test setup . 28
6.2.3 Test procedure and parameters . 29
6.3 Immunity to impulses . 33
6.3.1 Test method . 33
6.3.2 Test setup . 33
6.3.3 Test procedure and parameters . 34
6.4 Electrostatic Discharge (ESD) . 36
6.4.1 Test method . 36
6.4.2 Test setup . 36
6.4.3 Test procedure and parameters . 41
7 Test report . 43
Annex A (normative) Ethernet test circuits . 44
A.1 General . 44
A.2 Test circuit for Ethernet transceivers for functional tests . 44
A.3 Test circuit for Ethernet transceivers for ESD test . 46
Annex B (normative) Test circuit boards. 49
B.1 Test circuit board for transceiver network configuration . 49
B.2 Test circuit board for single transceiver configuration . 51
Annex C (informative) Test of Ethernet transceiver for radiated RF emission and RF
immunity . 53
C.1 General . 53
C.2 General configuration for transceiver network . 53
C.3 Tests . 54
C.3.1 General . 54
C.3.2 Emission of radiated RF disturbances . 58
C.3.3 Immunity to radiated RF disturbances . 59
Annex D (informative) Examples for test limits for Ethernet transceiver in automotive
application . 63
D.1 General . 63
D.2 Emission of conducted RF disturbances . 63
D.3 Immunity to conducted RF disturbances . 64
D.4 Immunity to impulses . 68
D.5 Electrostatic discharge (ESD) . 68
D.6 Emission of radiated RF disturbances . 69
D.7 Immunity to radiated RF disturbances . 70
Annex E (informative) Characterization of common mode chokes for EMC evaluation
of Ethernet transceivers . 72
E.1 General . 72
E.2 Test . 72
E.2.1 General . 72
E.2.2 S-parameter measurement mixed mode . 73
E.2.3 ESD damage . 80
E.2.4 Saturation test at RF disturbances . 82
E.2.5 Saturation test at ESD . 85
E.2.6 TDR measurement of differential mode impedance . 87
Annex F (informative) Characterization of ESD suppression devices for EMC
evaluation of Ethernet transceivers . 89
F.1 General . 89
F.2 Test . 90
F.2.1 General . 90
F.2.2 S-parameter measurement mixed mode . 91
F.2.3 ESD damage . 97
F.2.4 ESD discharge current measurement . 100
F.2.5 Test of unwanted clamping effect at RF immunity tests . 104
Bibliography . 108
Figure 1 – Minimum MDI interface test network (Min-BIN) . 16
Figure 2 – Standard MDI interface test network (Std-BIN) . 16
– 4 – IEC 62228-5:2021 © IEC 2021
Figure 3 – Optimized MDI interface test network (Opt-BIN) . 16
Figure 4 – General test configuration for tests in transceiver network for conducted
tests . 17
Figure 5 – General test configuration for unpowered ESD test .
...