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IEC 62271-101
Edition 3.0 2021-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
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IEC 62271-101
Edition 3.0 2021-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
High-voltage switchgear and controlgear –
Part 101: Synthetic testing
Appareillage à haute tension –
Partie 101: Essais synthétiques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.130.10 ISBN 978-2-8322-1004-6
– 2 – IEC 62271-101:2021 © IEC 2021
CONTENTS
FOREWORD . 9
1 Scope . 11
2 Normative references. 11
3 Terms and definitions . 11
4 Synthetic testing techniques and methods for short-circuit breaking tests . 13
4.1 Basic principles and general requirements for synthetic breaking test
methods . 13
4.1.1 General . 13
4.1.2 High-current interval . 14
4.1.3 Interaction interval . 15
4.1.4 High-voltage interval . 15
4.2 Synthetic test circuits and related specific requirements for breaking tests . 18
4.2.1 Current injection methods . 18
4.2.2 Voltage injection method . 19
4.2.3 Duplicate circuit method (transformer or Skeats circuit) . 20
4.2.4 Other synthetic test methods . 20
4.3 Three-phase synthetic test methods . 20
5 Synthetic testing techniques and methods for short-circuit making tests . 24
5.1 Basic principles and general requirements for synthetic making test methods . 24
5.1.1 General . 24
5.1.2 High-voltage interval . 27
5.1.3 Pre-arcing interval . 27
5.1.4 Latching interval and fully closed position . 27
5.2 Synthetic test circuit and related specific requirements for making tests . 27
5.2.1 General . 27
5.2.2 Test circuit and test requirements . 27
5.2.3 Alternative test method with reduced voltage . 32
7 Type tests . 33
7.102 General . 33
7.104 Demonstration of arcing times . 34
7.107 Terminal fault tests . 45
7.109 Short-line fault tests . 49
7.110 Out-of-phase making and breaking tests . 50
7.111 Capacitive current tests . 50
Annex A (normative) Correction of di/dt and TRV for test duty T100a . 53
A.1 General . 53
A.2 Reduction in di/dt . 53
A.3 Corrected TRV for the first-pole-to-clear with required asymmetry . 53
A.4 Correction of the di/dt and TRV of the first-pole-to-clear for tests with
intermediate asymmetry . 60
A.5 Correction of the di/dt and TRV of the second- or last-pole-to-clear with
major extended loop with required asymmetry during three-phase tests . 61
A.6 Correction of the di/dt and TRV during tests with a subsequent minor loop . 61
A.7 Calculation of the di/dt and TRV of the first-pole-to-clear . 61
A.7.1 General . 61
A.7.2 Calculation of di/dt . 61
A.7.3 Calculation of TRV . 62
A.7.4 Examples of calculation of di/dt and TRV . 64
Annex B (normative) Tolerances on test quantities for type tests . 66
Annex C (normative) Information to be given and results to be recorded for synthetic
tests . 69
C.1 General . 69
C.2 Auxiliary circuit-breaker . 69
C.3 Test conditions . 69
C.4 Quantities to be recorded . 69
C.4.1 General . 69
C.4.2 Voltages . 69
C.4.3 Currents . 69
Annex D (normative) Test procedure using a three-phase current circuit and one
voltage circuit . 70
D.1 Test circuit . 70
D.2 Test method . 71
D.2.1 General . 71
D.2.2 Test duty T100s(b) . 71
D.2.3 Test duty T100a . 80
D.2.4 Combination of first-pole-to-clear factors 1,3 and 1,5 . 89
Annex E (normative) Splitting of test duties in test series taking into account the
associated TRV for each pole-to-clear . 92
E.1 General . 92
E.2 Test-duties T10, T30, T60, T100s(b), OP1 and OP2(b). 92
E.2.1 Test procedure for first-pole-to-clear factors 1,5 and 2,5 . 92
E.2.2 Test procedure for first-pole-to-clear factors 1,3 and 2,0 . 93
E.2.3 Test procedure for first-pole-to-clear factor 1,2 . 94
E.3 Test duty T100a . 95
E.3.1 General . 95
E.3.2 Test procedure for first-pole-to-clear factor 1,5 . 96
E.3.3 Test procedure for first-pole-to-clear factor 1,3 . 97
E.3.4 Test procedure for first-pole-to-clear factor 1,2 . 99
E.4 Combination of first-pole-to-clear factors .
...