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IEC 62586-2
Edition 2.0 2021-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AM ENDMENT 1
AM ENDEMENT 1
Power quality measurement in power supply systems –
Part 2: Functional tests and uncertainty requirements
Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –
Partie 2: Essais fonctionnels et exigences d'incertitude
IEC 62586-2:2017-03/AMD1:2021-09(en-fr)
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IEC 62586-2
Edition 2.0 2021-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AM ENDMENT 1
AM ENDEMENT 1
Power quality measurement in power supply systems –
Part 2: Functional tests and uncertainty requirements
Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –
Partie 2: Essais fonctionnels et exigences d'incertitude
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-9930-2
– 2 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –
Part 2: Functional tests and uncertainty requirements
AMENDMENT 1
FOREWORD
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Amendment 1 to IEC 62586-2:2017 has been prepared by IEC technical committee 85:
Measuring equipment for electrical and electromagnetic quantities.
The text of this amendment is based on the following documents:
FDIS Report on voting
85/770/FDIS 85/795/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.
© IEC 2021
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at /members_experts/refdocs. The main document types developed by IEC are
described in greater detail at /standardsdev/publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.
_____________
5.1.4 Single "power-system influence quantities"
c d
Replace in Table 4 the footnotes and with:
c
This signal represents a crest factor of 2 and applies to voltage signals.
d
This signal represents a crest factor of 3 and applies to current signals.
6.2.2.2 Variations due to single influence quantities
Replace Subclause 6.2.2.2 by the following:
Each test shall last at least 1 s.
No. Target of the test Testing points Complementary test Test criterion (if
according to Table 3 conditions according test is applicable)
to Table 4
A2.3.1 Measure influence of P3 for voltage S1 for frequency TC10/12(unc)
frequency on measurement magnitude
S3 for frequency
uncertainty (for further
calculations as required in
8)
A2.3.2 Measure influence of P3 for voltage S1 for harmonics TC10/12(unc) on
harmonics on measurement magnitude ch1 compared to a
uncertainty (for further reference voltage
calculations as required in
8)
6.4.1 General
Clarification about units of y axis; replace Figure 1 by the following:
– 4 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
Figure 1 – Overview of test for dips according to test A4.1.1
© IEC 2021
Clarification about units of y axis; replace Figure 2 by the following:
Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
Replace Figure 3 by the following (clarification about hysteresis):
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
– 6 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
In Figure 4, correction of values, by expressing them in % of U and by adding a significant
din
digit. Replace Figure 4 by the following:
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N N + 1 N + 2 N + 3 N + 4 N + 5 N + 6 N + 7
100 % U 70,7 % U 0 % U 0 % U 0 % U 63,6 % U 90 % U 90 % U
din din din din din din din din
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 8 N + 9 N + 10 N + 11 N + 12 N + 13 N + 14 N + 15
90 % U 92 % U 94 % U 94 % U 94 % U 94 % U 94 % U 94 % U
din din din din din din din din
Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
In Figure 5, correction of signal level to match test point P3 for dips/interruptions, and correction
of scale now expressed in % of U . Replace Figure 5 by the following:
din
Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
© IEC 2021
In Figure 6, correction of signal level to match test point P3 for dips/interruptions, and correction
of scale now expressed in % of U . Replace Figure 6 by the following:
din
Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
In Figure 7, correction of the scale, now expressed in % of U . Replace Figure 7 by the
din
following:
Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
– 8 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
In Figure 8, correction of the scale, now expressed in % of U . Replace Figure 8 by the
din
following:
Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
Update of the scale in Figure 9 as follows:
Figure 9 – Sliding reference voltage test
6.13 Rapid voltage changes (RVC)
Replace the entire Subclause 6.13 by the following:
© IEC 2021
6.13 Rapid voltage changes (RVC)
6.13.1 RVC parameters and evaluation
An RVC event is characterized by four para
...