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SLOVENSKI STANDARD
01-februar-2022
Merjenje kakovosti električne energije v napajalnih sistemih - 2. del: Zahteve za
funkcionalne preskuse in negotovost - Dopolnilo A1 (IEC 62586-
2:2017/AMD1:2021)
Power quality measurement in power supply systems - Part 2: Functional tests and
uncertainty requirements (IEC 62586-2:2017/AMD1:2021)
Messung der Spannungsqualität in Energieversorgungssystemen - Teil 2:
Funktionsprüfungen und Anforderungen an die Messunsicherheit (IEC 62586-
2:2017/AMD1:2021)
Mesure de la qualité de l'alimentation dans les réseaux d'alimentation - Partie 2: Essais
fonctionnels et exigences d'incertitude (IEC 62586-2:2017/AMD1:2021)
Ta slovenski standard je istoveten z: EN 62586-2:2017/A1:2021
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN 62586-2:2017/A1
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2021
ICS 17.220.20
English Version
Power quality measurement in power supply systems - Part 2:
Functional tests and uncertainty requirements
(IEC 62586-2:2017/AMD1:2021)
Mesure de la qualité de l'alimentation dans les réseaux Messung der Spannungsqualität in
d'alimentation - Partie 2: Essais fonctionnels et exigences Energieversorgungssystemen - Teil 2: Funktionsprüfungen
d'incertitude und Anforderungen an die Messunsicherheit
(IEC 62586-2:2017/AMD1:2021) (IEC 62586-2:2017/AMD1:2021)
This amendment A1 modifies the European Standard EN 62586-2:2017; it was approved by CENELEC on 2021-10-20. CENELEC
members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this amendment the
status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This amendment exists in three official versions (English, French, German). A version in any other language made by translation under the
responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as
the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62586-2:2017/A1:2021 E
European foreword
The text of document 85/770/FDIS, future IEC 62586-2/AMD1, prepared by IEC/TC 85 “Measuring
equipment for electrical and electromagnetic quantities” was submitted to the IEC-CENELEC parallel
vote and approved by CENELEC as EN 62586-2:2017/A1:2021.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022–07–20
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024–10–20
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
This document has been prepared under a Standardization Request given to CENELEC by the
European Commission and the European Free Trade Association.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62586-2:2017/AMD1:2021 was approved by CENELEC as
a European Standard without any modification.
IEC 62586-2
Edition 2.0 2021-09
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
AM ENDMENT 1
AM ENDEMENT 1
Power quality measurement in power supply systems –
Part 2: Functional tests and uncertainty requirements
Mesure de la qualité de l'alimentation dans les réseaux d'alimentation –
Partie 2: Essais fonctionnels et exigences d'incertitude
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 17.220.20 ISBN 978-2-8322-9930-2
– 2 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
POWER QUALITY MEASUREMENT IN POWER SUPPLY SYSTEMS –
Part 2: Functional tests and uncertainty requirements
AMENDMENT 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence between
any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. IEC shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to IEC 62586-2:2017 has been prepared by IEC technical committee 85:
Measuring equipment for electrical and electromagnetic quantities.
The text of this amendment is based on the following documents:
FDIS Report on voting
85/770/FDIS 85/795/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Amendment is English.
IEC 62586-2:2017/AMD1:2021 – 3 –
© IEC 2021
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at /members_experts/refdocs. The main document types developed by IEC are
described in greater detail at /standardsdev/publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.
_____________
5.1.4 Single "power-system influence quantities"
c d
Replace in Table 4 the footnotes and with:
c
This signal represents a crest factor of 2 and applies to voltage signals.
d
This signal represents a crest factor of 3 and applies to current signals.
6.2.2.2 Variations due to single influence quantities
Replace Subclause 6.2.2.2 by the following:
Each test shall last at least 1 s.
No. Target of the test Testing points Complementary test Test criterion (if
according to Table 3 conditions according test is applicable)
to Table 4
A2.3.1 Measure influence of P3 for voltage S1 for frequency TC10/12(unc)
frequency on measurement magnitude
S3 for frequency
uncertainty (for further
calculations as required in
8)
A2.3.2 Measure influence of P3 for voltage S1 for harmonics TC10/12(unc) on
harmonics on measurement magnitude ch1 compared to a
uncertainty (for further reference voltage
calculations as required in
8)
6.4.1 General
Clarification about units of y axis; replace Figure 1 by the following:
– 4 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
Figure 1 – Overview of test for dips according to test A4.1.1
IEC 62586-2:2017/AMD1:2021 – 5 –
© IEC 2021
Clarification about units of y axis; replace Figure 2 by the following:
Figure 2 – Detail 1 of waveform for test of dips according to test A4.1.1
Replace Figure 3 by the following (clarification about hysteresis):
Figure 3 – Detail 2 of waveform for tests of dips according to A4.1.1
– 6 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
In Figure 4, correction of values, by expressing them in % of U and by adding a significant
din
digit. Replace Figure 4 by the following:
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N N + 1 N + 2 N + 3 N + 4 N + 5 N + 6 N + 7
100 % U 70,7 % U 0 % U 0 % U 0 % U 63,6 % U 90 % U 90 % U
din din din din din din din din
U U U U U U U U
rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½) rms(½)
N + 8 N + 9 N + 10 N + 11 N + 12 N + 13 N + 14 N + 15
90 % U 92 % U 94 % U 94 % U 94 % U 94 % U 94 % U 94 % U
din din din din din din din din
Figure 4 – Detail 3 of waveform for tests of dips according to test A4.1.1
In Figure 5, correction of signal level to match test point P3 for dips/interruptions, and correction
of scale now expressed in % of U . Replace Figure 5 by the following:
din
Figure 5 – Detail 1 of waveform for test of dips according to test A4.1.2
IEC 62586-2:2017/AMD1:2021 – 7 –
© IEC 2021
In Figure 6, correction of signal level to match test point P3 for dips/interruptions, and correction
of scale now expressed in % of U . Replace Figure 6 by the following:
din
Figure 6 – Detail 2 of waveform for tests of dips according to test A4.1.2
In Figure 7, correction of the scale, now expressed in % of U . Replace Figure 7 by the
din
following:
Figure 7 – Detail 1 of waveform for test of swells according to test A4.1.2
– 8 – IEC 62586-2:2017/AMD1:2021
© IEC 2021
In Figure 8, correction of the scale, now expressed in % of U . Replace Figure 8 by the
din
following:
Figure 8 – Detail 2 of waveform for tests of swells according to test A4.1.2
Update of the scale in Figure 9 as follows:
Figure 9 – Sliding reference voltage test
6.13 Rapid voltage changes (RVC)
Replace the entire Subclause 6.13 by the following:
IEC 62586-2:2017/AMD1:2021 – 9 –
© IEC 2021
6.13 Rapid voltage changes (RVC)
6.13.1 RVC parameters and evaluation
An RVC event is characterized by four parameters:
• start time,
• duration,
,
• ∆U
max
• ∆U .
ss
The start time of an RVC event shall be time-stampe
...