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SIST EN 60689:2009
01-maj-2009
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Measurement and test methods for tuning fork quartz crystal units in the range from 10
kHz to 200 kHz and standard values (IEC 60689:2008)
Mess- und Prüfverfahren für Stimmgabelquarze im Frequenzbereich von 10 kHz bis 200
kHz sowie Richtwerte (IEC 60689:2008)
Méthodes de mesure et d’essai concernant le réglage des résonateurs à quartz dans la
plage comprise entre 10 kHz et 200 kHz et valeurs normales (CEI 60689:2008)
Ta slovenski standard je istoveten z: EN 60689:2009
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60689:2009 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 60689:2009
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SIST EN 60689:2009
EUROPEAN STANDARD
EN 60689
NORME EUROPÉENNE
March 2009
EUROPÄISCHE NORM
ICS 31.140
English version
Measurement and test methods for tuning fork quartz crystal units
in the range from 10 kHz to 200 kHz and standard values
(IEC 60689:2008)
Méthodes de mesure et Mess- und Prüfverfahren
d’essai concernant le réglage für Stimmgabelquarze
des résonateurs à quartz im Frequenzbereich
dans la plage comprise entre von 10 kHz bis 200 kHz
10 kHz et 200 kHz et valeurs normales sowie Richtwerte
(CEI 60689:2008) (IEC 60689:2008)
This European Standard was approved by CENELEC on 2009-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: avenue Marnix 17, B - 1000 Brussels
© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60689:2009 E
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SIST EN 60689:2009
EN 60689:2009 - 2 -
Foreword
The text of document 48/809/FDIS, future edition 2 of IEC 60689, prepared by IEC TC 49, Piezoelectric
and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 60689 on 2009-03-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2009-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2012-03-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60689:2008 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60068-1 NOTE Harmonized as EN 60668-1:1994 (not modified).
IEC 60068-2-1 NOTE Harmonized as EN 60668-2-1:2007 (not modified).
IEC 60068-2-2 NOTE Harmonized as EN 60668-2-2:2007 (not modified).
IEC 60068-2-7 NOTE Harmonized as EN 60668-2-7:1993 (not modified).
IEC 60068-2-13 NOTE Harmonized as EN 60668-2-13:1999 (not modified).
IEC 60068-2-14 NOTE Harmonized as EN 60668-2-14:1999 (not modified).
IEC 60068-2-17 NOTE Harmonized as EN 60668-2-17:1994 (not modified).
IEC 60068-2-20 NOTE Harmonized as EN 60668-2-20:2008 (not modified).
IEC 60068-2-21 NOTE Harmonized as EN 60668-2-21:2006 (not modified).
IEC 60068-2-27 NOTE Harmonized as EN 60668-2-27:1993 (not modified).
IEC 60068-2-30 NOTE Harmonized as EN 60668-2-30:2005 (not modified).
IEC 60068-2-31 NOTE Harmonized as EN 60668-2-31:2008 (not modified).
IEC 60068-2-45 NOTE Harmonized as EN 60668-2-45:1992 (not modified).
IEC 60068-2-78 NOTE Harmonized as EN 60668-2-78:2001 (not modified).
__________
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SIST EN 60689:2009
- 3 - EN 60689:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60027 Series Letter symbols to be used in electrical EN 60027 Series
technology
1)
IEC 60050-561 - International Electrotechnical Vocabulary - -
(IEV) -
Chapter 561: Piezoelectric devices for
frequency control and selection
1) 2)
IEC 60122-1 - Quartz crystal units of assessed quality - EN 60122-1 2002
Part 1: Generic specification
1) 2)
IEC 60122-3 - Quartz crystal units of assessed quality - EN 60122-3 2001
Part 3: Standard outlines and lead
connections
IEC 60444 Series Measurement of quartz crystal unit EN 60444 Series
parameters by zero phase technique
in a pi-network
IEC 60617 Data- Graphical symbols for diagrams - -
base
ISO 1000 1992 SI units and recommendations for the use - -
of their multiples and of certain other units
1)
Undated reference.
2)
Valid edition at date of issue.
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SIST EN 60689:2009
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SIST EN 60689:2009
IEC 60689
Edition 2.0 2008-11
INTERNATIONAL
STANDARD
Measurement and test methods for tuning fork quartz crystal units in the range
from 10 kHz to 200 kHz and standard values
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 31.140 ISBN 2-8318-1018-6
Registered trademark of the International Electrotechnical Commission
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SIST EN 60689:2009
– 2 – 60689 © IEC:2008(E)
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Overview .6
3.1 General .6
3.2 Applied frequency range.6
3.3 Measurement method.6
3.4 Load capacitance .7
3.5 Recommended drive level .7
3.6 Measurement conditions.7
3.7 Measurement of frequency-temperature characteristics.7
3.8 Load capacitance frequency characteristics .7
4 Measurement methods .7
4.1 Method A.7
4.1.1 Vector network analyzer/vector impedance analyzer.7
4.1.2 Block diagram.7
4.1.3 Specifications for vector network analyzer/vector impedance analyzer .8
4.1.4 Test fixture .8
4.1.5 Measurement of equivalent circuit constants .9
4.1.6 Frequency pulling .10
4.2 Method B.10
4.2.1 General .10
4.2.2 Block diagram.10
4.2.3 Calibration.11
4.2.4 Procedure.12
5 Measurement conditions.12
5.1 General .12
5.2 Measurement conditions.12
5.3 Measurement of the frequency-temperature dependence .13
5.3.1 General .13
5.3.2 Block diagram.13
5.3.3 Determination of the turnover point and parabolic coefficient β
(standard reference method) .14
5.3.4 Measurement of the frequency versus temperature characteristics
(mass production method) .14
5.3.5 Frequency C curve.15
L
6 Test and environmental examination .15
6.1 Application of the definition of IEC 60122-1 .15
6.2 Magnetism – Influence of a magnetic field on the frequency .16
6.3 Enclosure .16
6.4 Measuring conditions and electric performance .16
6.4.1 General .16
6.4.2 Measurement conditions.16
6.4.3 Standard values .16
Bibliography.18
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SIST EN 60689:2009
60689 © IEC:2008(E) – 3 –
Figure 1 – Block diagram of the measurement method using the vector network
analyzer or vector impedance analyzer .8
Figure 2 – Block diagram of test fixture.9
Figure 3 – Block diagram of test fixture (including a load capacitance).9
Figure 4 – Block diagram of test fixture for bridge method .11
Figure 5 – Block diagram of test fixture for bridge method (including a load
capacitance) .11
Figure 6 – Block diagram of measurement of the frequency-temperature dependence .13
Figure 7 – Frequency–temperature template
(Turnover point: 25 ± 5 °C, β =－45 × 10 /°C ) .14
–9 2
Figure 8a) – Δ f/f versus C curve .15
L
Figure 8b) – Δ f/f versus C curve .15
L
Figure 8 – Δ f/f versus C curve with different C .15
L Ls
Table 1 – Specifications for vector network analyzer/vector impedance analyzer .8
Table 2 – Standard values .17
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SIST EN 60689:2009
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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT AND TEST METHODS FOR TUNING FORK
QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz
AND STANDARD VALUES
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60689 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
This second edition cancels and replaces the first edition published in 1980. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) The title of the first edition is Measurements and test methods for 32 kHz quartz crystal
units for wrist watches and standard values. The title is modified and the frequency
range of this second edition is extended to the range from 10 kHz to 200 kHz.
b) The Lissajous method is defined in the first edition as the standard measurement
method. The PI network and bridge method are used in this second edition.
c) The PI network has a transformer for impedance matching. This composition differs
from that of IEC 60444-1.
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SIST EN 60689:2009
60689 © IEC:2008(E) – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
49/809/FDIS 49/815/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition; or
• amended.
A bilingual version of this publication may be issued at a later date.
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SIST EN 60689:2009
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MEASUREMENT AND TEST METHODS FOR TUNING FORK
QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz
AND STANDARD VALUES
1 Scope
This International Standard applies to measurements and test methods for tuning fork quartz
crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control
and selection.
2 Normative referen
...