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SIST EN 61280-2-3:2009
01-november-2009
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Fibre optic communication subsystem basic test procedures - Part 2-3: Test procedures
for digital systems - Jitter and wander measurements (IEC 61280-2-3:2009)
Lichtwellenleiter-Kommunikationsuntersysteme - Prüfverfahren - Teil: 2-3: Digitale
Systeme - Messung von Jitter und Wander (IEC 61280-2-3:2009)
Procédures d'essai des sous-systèmes de télécommunications à fibres optiques - Partie
2-3: Systèmes numériques - Mesures des gigues et des dérapages (CEI 61280-2-
3:2009)
Ta slovenski standard je istoveten z: EN 61280-2-3:2009
ICS:
33.180.01 6LVWHPL]RSWLþQLPLYODNQLQD Fibre optic systems in
VSORãQR general
SIST EN 61280-2-3:2009 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 61280-2-3:2009
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SIST EN 61280-2-3:2009
EUROPEAN STANDARD
EN 61280-2-3
NORME EUROPÉENNE
September 2009
EUROPÄISCHE NORM
ICS 33.180.01
English version
Fibre optic communication subsystem test procedures -
Part 2-3: Digital systems -
Jitter and wander measurements
(IEC 61280-2-3:2009)
Procédures d'essai des sous-systèmes Prüfverfahren für Lichtwellenleiter-
de télécommunications à fibres optiques - Kommunikationsuntersysteme -
Partie 2-3: Systèmes numériques - Teil: 2-3: Digitale Systeme -
Mesures des gigues et des dérapages Messung von Jitter und Wander
(CEI 61280-2-3:2009) (IEC 61280-2-3:2009)
This European Standard was approved by CENELEC on 2009-08-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: Avenue Marnix 17, B - 1000 Brussels
© 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61280-2-3:2009 E
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SIST EN 61280-2-3:2009
EN 61280-2-3:2009 - 2 -
Foreword
The text of document 86C/885/FDIS, future edition 1 of IEC 61280-2-3, prepared by SC 86C, Fibre optic
systems and active devices, of IEC TC 86, Fibre optics, was submitted to the IEC-CENELEC parallel vote
and was approved by CENELEC as EN 61280-2-3 on 2009-08-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2010-05-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2012-08-01
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 61280-2-3:2009 was approved by CENELEC as a European
Standard without any modification.
__________
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SIST EN 61280-2-3:2009
- 3 - EN 61280-2-3:2009
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
1) 2)
IEC 60825-1 - Safety of laser products - EN 60825-1 2007
Part 1: Equipment classification and
requirements
1)
ITU-T - Timing characteristics of SDH equipment - -
Recommendation slave clocks (SEC)
G.813
1)
Undated reference.
2)
Valid edition at date of issue.
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SIST EN 61280-2-3:2009
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SIST EN 61280-2-3:2009
IEC 61280-2-3
Edition 1.0 2009-07
INTERNATIONAL
STANDARD
Fibre optic communication subsystem test procedures –
Part 2-3: Digital systems – Jitter and wander measurements
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
W
ICS 33.180.01 ISBN 2-8318-1051-4
Registered trademark of the International Electrotechnical Commission
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SIST EN 61280-2-3:2009
– 2 – 61280-2-3 © IEC:2009(E)
CONTENTS
FOREWORD.5
1 Scope.7
1.1 Types of jitter measurements .7
1.2 Types of wander measurements .7
2 Normative references .7
3 Terms and definitions .7
4 General considerations.11
4.1 Jitter generation .11
4.1.1 Timing jitter .11
4.1.2 Alignment jitter .11
4.1.3 Other effects.12
4.2 Effects of jitter on signal quality.12
4.3 Jitter tolerance .12
4.4 Waiting time jitter .13
4.5 Wander .14
5 Jitter test procedures.14
5.1 General considerations.14
5.1.1 Analogue method .14
5.1.2 Digital method .14
5.2 Common test equipment.15
5.3 Safety .16
5.4 Fibre optic connections .17
5.5 Test sample .17
6 Jitter tolerance measurement procedure.17
6.1 Purpose .17
6.2 Apparatus.17
6.3 BER penalty technique .17
6.3.1 Equipment connection .17
6.3.2 Equipment settings .18
6.3.3 Measurement procedure .18
6.4 Onset of errors technique .18
6.4.1 Equipment connection .18
6.4.2 Equipment settings .19
6.4.3 Measurement procedure .19
6.5 Jitter tolerance stressed eye receiver test .20
6.5.1 Purpose.20
6.5.2 Apparatus.20
6.5.3 Sinusoidal jitter template technique .20
7 Measurement of jitter transfer function .21
7.1 General .21
7.2 Apparatus.21
7.3 Basic technique.22
7.3.1 Equipment connection .22
7.3.2 Equipment settings .22
7.3.3 Measurement procedure .22
7.4 Analogue phase detector technique.23
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61280-2-3 © IEC:2009(E) – 3 –
7.4.1 Equipment connections.23
7.4.2 Equipment settings .23
7.4.3 Measurement procedure .24
7.4.4 Measurement calculations .24
8 Measurement of output jitter .24
8.1 General .24
8.2 Equipment connection .24
8.2.1 Equipment settings .24
8.2.2 Measurement procedure .24
8.2.3 Controlled data.25
9 Measurement of systematic jitter .25
9.1 Apparatus.25
9.2 Basic technique.25
9.2.1 Equipment connection .25
9.2.2 Equipment settings .26
9.2.3 Measurement procedure .26
10 BERT scan technique .27
10.1 Apparatus.29
10.2 Basic technique.29
10.2.1 Equipment connection .29
10.2.2 Equipment settings .29
10.2.3 Measurement process .29
11 Jitter separation technique .30
11.1 Apparatus.31
11.2 Equipment connections .31
11.3 Equipment settings.31
11.4 Measurement procedure.32
11.4.1 Sampling oscilloscope: .32
11.4.2 Real-time oscilloscope.32
12 Measurement of wander .33
12.1 Apparatus.33
12.2 Basic technique.33
12.2.1 Equipment connection .33
12.2.2 Equipment settings .34
12.2.3 Measurement procedure .35
13 Measurement of wander TDEV tolerance.35
13.1 Intent.35
13.2 Apparatus.35
13.3 Basic technique.35
13.4 Equipment connection .35
13.4.1 Wander TDEV tolerance measurement for the test signal of EUT .35
13.4.2 Wander TDEV tolerance measurement for timing reference signal of
EUT.36
13.5 Equipment settings.36
13.6 Measurement procedure.37
14 Measurement of wander TDEV transfer .37
14.1 Apparatus.37
14.2 Equipment connection .37
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14.2.1 Wander TDEV transfer measurement for the test signal of EUT .37
14.2.2 Wander TDEV transfer measurement for timing reference signal of
EUT.37
14.3 Equipment settings.38
14.4 Measurement procedure.38
15 Test results .38
15.1 Mandatory information.38
15.2 Available information.39
Bibliography.40
Figure 1 – Jitter generation .11
Figure 2 – Example of jitter tolerance.13
Figure 3 – Jitter and wander generator .15
Figure 4 – Jitter and wander measurement .16
Figure 5 – Jitter stress generator .16
Figure 6 – Jitter tolerance measurement configuration: bit error ratio (BER) penalty
technique.18
Figure 7 – Jitter tolerance measurement configuration: Onset of errors technique .19
Figure 8 – Equipment configuration for stressed eye tolerance test.20
Figure 9 – Measurement of jitter transfer function: basic technique.22
Figure 10 – Measurement of Jitter transfer: analogue phase detector technique .23
Figure 11 – Output jitter measurement .25
Figure 12 – Systematic jitter measurement configuration: basic technique .26
Figure 13 – Measurement of the pattern-dependent phase sequence xi .27
Figure 14 – BERT scan bathtub curves (solid line for low jitter, dashed line for high
jitter).28
Figure 15 – Equipment setup for the BERT scan.29
Figure 16 – Dual Dirac jitter model.31
Figure 17 – Equipment setup for jitter separation measurement.31
Figure 18 – Measurement of time interval error.32
Figure 19 – Synchronized wander measurement configuration.34
Figure 20 – Non-synchronized wander measurement configuration .34
Figure 21 – Wander TDEV tolerance measurement configuration for the test signal of
EUT .36
Figure 22 – Wander TDEV tolerance measurement configuration for the timing signal
of EUT .36
Figure 23 – Wander TDEV transfer measurement configuration for the test signal of
EUT .37
Figure 24 – Wander TDEV transfer measurement configuration for the timing signal of
EUT .38
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SIST EN 61280-2-3:2009
61280-2-3 © IEC:2009(E) – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FIBRE OPTIC COMMUNICATION SUBSYSTEM
TEST PROCEDURES –
Part 2-3: Digital systems –
Jitter and wander measurements
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. The IEC collaborates
closely with the International Organization for Standardization (ISO) in accordance with conditions determined
by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61280-2-3 has been prepared by subcommittee 86C: Fibre optic
systems and active devices, of IEC technical committee 86: Fibre optics.
The text of this standard is based on the following documents:
FDIS Report on voting
86C/885/FDIS 86C/905/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
A list of all parts of the IEC 61280-2 series, published under the general title Fibre optic
communication subsystem test procedures – Digital systems, can be found on the IEC
website.
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SIST EN 61280-2-3:2009
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The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed;
• withdrawn;
• replaced by a revised edition, or
• amended.
A bilingual version may be published at a later date.
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SIST EN 61280-2-3:2009
61280-2-3 © IEC:2009(E) – 7 –
FIBRE OPTIC COMMUNICATION SUBSYSTEM
TEST PROCEDURES –
Part 2-3: Digital systems –
Jitter and wander measurements
1 Scope
This part of IEC 61280 specifies methods for the measurement of the jitter and wander
parameters associated with the transmission and handling of digital signals.
1.1 Types of jitter measurements
This standard covers the measurement of the following types of jitter parameters:
a) jitter tolerance
1) sinusoidal method
2) stressed eye method
b) jitter transfer function
c) output jitter
d) systematic jitter
e) jitter separation
1.2 Types of wander measurements
This standard covers the measurement of the following types of wander parameters:
a) non-synchronized wander
b) TDEV tolerance
c) TDEV transfer
d) synchronized wander
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60825-1, Safety of laser products – Part 1: Equipment classification and requirements
ITU-T Recommendation G.813, Timing characteristics of SDH equipment slave clocks (SEC)
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
NOTE See also IEC 61931.
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3.1
jitter
the short-term, non-cumulative, variation in time of the significant instances of a digital signal
from their ideal position in time. Short-term variations in this context are jitter components
with a repetition frequency equal to or exceeding 10 Hz
3.2
jitter amplitude
the deviation of the significant instance of a digital signal from its ideal position in time
NOTE For the purposes of this standard the jitter amplitude is expressed in terms of the unit interval (UI). It is
recognized that jitter amplitude may also be expressed in units of time.
3.3
unit interval (UI)
the shortest interval between two equivalent instances in ideal positions in time. In practice
this is equivalent to the ideal timing period of the digital signal
3.4
jitter frequency
the rate of variation in time of the significant instances of a digital signal relative to their ideal
position in time. Jitter frequency is expressed in Hertz (Hz)
3.5
jitter bandwidth
the jitter frequency at which the jitter amplitude has decreased by 3dB relative to its maximum
value
3.6
alignment jitter
jitter created when the timing of a data signal is recovered from the signal itself
3.7
timing jitter
jitter present on a timing source
3.8
systematic jitter
jitter components which are not random and have a predictable rate of occurrence.
Systematic jitter in a digital signal results from regularly recurring features in the digital signal,
such as frame alignment data, and justification control data. This is sometimes referred to as
deterministic jitter and is composed of periodic uncorrelated jitter and data dependent jitter
3.9
periodic uncorrelated jitter
a form of systematic jitter that occurs at a regular rate, but is uncorrelated to the data when
the data pattern repeats. Periodic uncorrelated jitter will be the same independent of which
edge in a pattern is observed over time. Sources of periodic uncorrelated jitter include
switching power supplies phase modulating reference clocks or any form of periodic phase
modulation of clocks that control data rates
3.10
inter-symbol interference jitter
caused by bandwidth limitations in transmission channels. If the c
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