IEC 62788-7-3:2022/AMD1:2024

Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 7-3: Accelerated stress tests - Methods of abrasion of PV module external surfaces

IEC 62788-7-3:2022/AMD1:2024

Name:IEC 62788-7-3:2022/AMD1:2024   Standard name:Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 7-3: Accelerated stress tests - Methods of abrasion of PV module external surfaces
Standard number:IEC 62788-7-3:2022/AMD1:2024   language:English and French language
Release Date:30-Jul-2024   technical committee:TC 82 - Solar photovoltaic energy systems
Drafting committee:WG 2 - TC 82/WG 2   ICS number:27.160 - Solar energy engineering

IEC 62788-7-3
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Measurement procedures for materials used in photovoltaic modules –
Part 7-3: Accelerated stress tests – Methods of abrasion of PV module external
Surfaces
Procédures de mesure des matériaux utilisés dans les modules
photovoltaïques –
Partie 7-3: Essais sous contraintes accélérés – Méthodes d’abrasion des
surfaces externes des modules photovoltaïques
IEC 62788-7-3:2022-02/AMD1:2024-07(en-fr)





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IEC 62788-7-3
Edition 1.0 2024-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
A MENDMENT 1
AM ENDEMENT 1
Measurement procedures for materials used in photovoltaic modules –
Part 7-3: Accelerated stress tests – Methods of abrasion of PV module external
Surfaces
Procédures de mesure des matériaux utilisés dans les modules
photovoltaïques –
Partie 7-3: Essais sous contraintes accélérés – Méthodes d’abrasion des
surfaces externes des modules photovoltaïques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 27.160 ISBN 978-2-8322-9435-2
– 2 – IEC 62788-7-3:2022/AMD1:2024

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT PROCEDURES FOR MATERIALS
USED IN PHOTOVOLTAIC MODULES –

Part 7-3: Accelerated stress tests –
Methods of abrasion of PV module external surfaces

AMENDMENT 1
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
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4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
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any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
patent(s). IEC takes no position concerning the evidence, validity or applicability of any claimed patent rights in
respect thereof. As of the date of publication of this document, IEC had not received notice of (a) patent(s), which
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shall not be held responsible for identifying any or all such patent rights.
Amendment 1 to IEC 62788-7-3:2022 has been prepared by IEC technical committee 82: Solar
photovoltaic energy systems.
The text of this Amendment is based on the following documents:
Draft Report on voting
82/2259/FDIS 82/2277/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.

The language used for the development of this Amendment is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at /members_experts/refdocs. The main document types developed by IEC are
described in greater detail at /publications/.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
_____________
CONTENTS
Add title of new Figure 1 and renumber Figure 1 to Figure 2.
4.2.2 Brush
Replace the existing text of subclause 4.2.2 by the following:
The brush block shall be (38 ± 1) mm × (89 ± 1) mm in area and (13 ± 1) mm in thickness.
The brush bristles shall consist of polyamide 612, poly(hexamethylene dodecanediamide) with
a 50:50 molar ratio of monomer types, (0,23 ± 0,03) mm in diameter that extend (38 ± 2) mm
from the brush block. Brushes with bristles shorter than 35 mm in length shall be replaced. The
bristle profile shall be round, with no taper or other change in geometry along their length. The
lateral repeat space of 6,4 mm shall be used for the bristle tuft rows across the width of the
brush and 12,7 mm shall be used for the bristle tuft columns along the length of the brush. For
the staggered bristles, an offset space of 3,2 mm between adjacent rows and lateral offset
space of 6,4 mm between adjacent bristle columns. The bristle tufts shall be staggered in a
5-4-5-4-. pattern along the brush, with total of 59 tufts. The bristle count shall be (158 ± 6)
−1
. See Figure 1.
tips⋅tuft
– 4 – IEC 62788-7-3:2022/AMD1:2024

Dimensions in millimetres
Figure 1 – Schematics showing the arrangement of bristle tufts on the linear brush
4.3.3 Reference material
Replace the existing text of subclause 4.3.3 by the following:
A reference material, which may be used to compare universally relative to the apparatus
manufacturer or between laboratories, shall be used to verify proper operation of the abrasion
tester, including the abrasive, abrasion apparatus, and the brush. The reference material shall
be used before specimens are tested, including after instrument installation or setup and
between test sessions. A reference material similar to the test specimen(s) is recommended
and should be used through the same measurement session. See Table 1.
Table 1 – Examples of suitable reference materials
Use Description Material Manufacturer
Default reference material, Super-white modified soda-lime glass
glass substrate or superstrate (DIN 52348) B 270 "Superwite" Schott AG
Hard thin film, monolithic silica
substrate or superstrate Technical glass Borofloat 33 Schott AG
UV durable, solar grade
Polymer substrate or superstrate bulk poly(methyl methacrylate)  Acrylite 0Z023 Röhm AG


Working reference materials, with similar characteristics as the suitable reference materials,
may be used for internal purposes. Additional coupons of a suitable reference or working
reference material should be tested alongside the test specimens (as blanks at the ends) during
the abrasion test.
5.2.2 Brush
Replace the existing text of the second paragraph by the following:
The brush bristles shall consist of polyamide 612, poly(hexamethylene dodecanediamide) with
a 50:50 molar ratio of monomer types, (0,23 ± 0,03) mm in diameter that extend (38 ± 2) mm
from the brush block. Brushes with bristles shorter than 35 mm in length shall be replaced. The
bristle profile shall be round, with no taper or other change in geometry along their length. As
shown in Figure 2, the lateral space of 12 mm shall be used for the bristle tuft columns along
the axial length of the brush, with a lateral offset space of 6 mm between adjacent bristle
columns and circum
...

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