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IEC 60747-5-10
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
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IEC 60747-5-10
Edition 1.0 2019-12
INTERNATIONAL
STANDARD
colour
inside
Semiconductor devices –
Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the
internal quantum efficiency based on the room-temperature reference point
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-7655-6
– 2 – IEC 60747-5-10:2019 © IEC:2019
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
3.1 Terms and definitions . 5
3.2 Abbreviated terms . 7
4 Measuring methods . 7
4.1 Basic requirements . 7
4.1.1 Measuring conditions . 7
4.1.2 Measuring instruments and equipment . 8
4.2 Purpose . 8
4.3 Measurement . 8
4.3.1 Measurement setup . 8
4.3.2 Measurement principle. 8
4.3.3 Measurement sequence . 8
5 Test report . 10
Annex A (informative) Test example. 11
Bibliography . 16
Figure 1 – Test flow . 10
Figure A.1 – Radiant power as a function of forward current . 11
Figure A.2 – Relative EQE as a function of forward current . 12
Figure A.3 – Determination of peak EQE point in the relative EQE curve . 12
Figure A.4 – Conversion to the normalized variables of X and Y . 13
Figure A.5 – Coefficients a and a as a function of X . 13
1 2
Figure A.6 – Verification of a reference point in the a curve . 14
Figure A.7 – IQE as a function of forward current . 14
Table A.1 – Summary of test report . 15
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
FOREWORD
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International Standard IEC 60747-5-10 has been prepared by subcommittee 47E: Discrete
semiconductor devices, of IEC technical committee 47: Semiconductor devices.
The text of this International Standard is based on the following documents:
CDV Report on voting
47E/652/CDV 47E/677/RVC
Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – IEC 60747-5-10:2019 © IEC:2019
A list of all parts in the IEC 60747 series, published under the general title Semiconductor
devices, can be found on the IEC website.
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standards in this series will be updated at the time of the next edition.
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• amended.
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SEMICONDUCTOR DEVICES –
Part 5-10: Optoelectronic devices – Light emitting diodes –
Test method of the internal quantum efficiency based on
the room-temperature reference point
1 Scope
This part of IEC 60747 specifies the measuring method of the internal quantum efficiency
(IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for
lighting applications are out of the scope of this document. This document utilizes only the
relative external quantum efficiency (EQE) measured at an operating room temperature. In
order to identify the reference IQE, an operating current corresponding to the injection
efficiency of 100 % is found and the radiative efficiency is determined by the infinitesimal
change of the relative EQE at that point. The IQE as a function of current is then calculated
from the relative ratio of the EQEs to the value at the reference point, which is called room-
temperature reference-point method (RTRM).
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60747-5-6:2016, Semiconductor devices – Part 5-6: Optoelectronic devices – Light
emitting diodes
3 Terms, definitions and abbreviated terms
3.1 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1.1
internal quantum efficiency
η
IQE
ratio of the number of photons emitted from the active region per unit time to the number of
electrons injected into the LED per unit time
Φ hν
e,active
η =
IQE
Iq
F
where
Φ is the radiant power emitted from the active region
e,active
hν is the mean photon energy
I is the forward current
F
q is the elementary charge
– 6 – IEC 60747-5-10:2019 © IEC:2019
Note 1 to entry: It is in general a function of ambient temperature (T ) and forward current (I ).
a F
[SOURCE: IEC 60747-5-8:2019, 3.2.4, modified – The note has been added.]
3.1.2
external quantum efficiency
η
EQE
ratio of the number of photons emitted into the free space per unit time to the number of
electrons injected into the LED per unit time
Φ hν
e
η =
EQE
Iq
F
where
Φ is the radiant power
e
Note 1 to entry: It is in general a function of ambient temperature (T ) and forward current (I ).
a F
[SOURCE: IEC 60747-5-8:2019, 3.2.3, mod
...