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IEC 60747-17
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
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IEC 60747-17
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-8801-6
– 2 – IEC 60747-17:2020 © IEC 2020
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 Electrical characteristics – Coupler logic and timing definitions . 19
5 Coupler for protection against electrical shock . 20
5.1 General . 20
5.2 Type . 20
5.3 Ratings . 20
5.3.1 General . 20
5.3.2 Safety limiting values . 20
5.3.3 Functional ratings . 20
5.3.4 Rated isolation voltages. 20
5.4 Electrical safety requirements . 20
5.5 Electrical, environmental and/or endurance test information . 21
5.5.1 General . 21
5.5.2 Routine test . 23
5.5.3 Sample test . 23
5.5.4 Maximum surge isolation voltage . 23
5.5.5 Type test . 24
6 Measuring methods for couplers . 35
6.1 General . 35
6.2 Isolation capacitance (C ) . 35
lO
6.2.1 Purpose . 35
6.2.2 Circuit diagram . 35
6.2.3 Measurement procedure . 36
6.2.4 Precautions to be observed . 36
6.2.5 Special conditions . 36
6.3 Isolation resistance between input and output, R . 36
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6.3.1 Purpose . 36
6.3.2 Circuit diagram . 36
6.3.3 Precautions to be observed . 37
6.3.4 Measurement procedure . 37
6.3.5 Special conditions . 37
6.4 Isolation test . 37
6.4.1 Purpose . 37
6.4.2 Circuit diagram . 37
6.4.3 Test procedure . 38
6.4.4 Requirements . 38
6.5 Partial discharges of coupler . 39
6.5.1 Purpose . 39
6.5.2 Circuit diagram . 39
6.5.3 Description of Figure 9 test circuit and requirements . 39
6.5.4 Test procedure . 40
6.5.5 Description of calibration circuit (see Figure 10) . 40
6.5.6 Test methods . 41
6.5.7 Specified conditions . 41
6.5.8 Test voltage conditions . 42
6.6 Switching times of couplers . 42
6.6.1 Purpose . 42
6.6.2 Circuit diagram . 42
6.6.3 Measurement procedure . 43
6.6.4 Specified conditions . 44
6.7 Measuring methods of common-mode transient immunity (CMTI) for
magnetic and capacitive couplers . 44
6.7.1 Purpose . 44
6.7.2 Circuit diagram . 44
6.7.3 Precautions to be observed . 45
6.7.4 Static CMTI measuring procedure . 46
6.7.5 Specified conditions . 47
6.7.6 Dynamic CMTI measuring procedure . 47
Annex A (informative) Qualification guidance . 48
Bibliography . 51
Figure 1 – Time intervals for methods a and b of the test voltage . 15
Figure 2 –1,2/50 µs surge pulse according 61000-4-5:2014 allowed as equivalent
impulse for isolation testing . 24
Figure 3 – Determination of time to failure (referring to method in 5.5.5.8) . 31
Figure 4 – Determination of working voltage (referring to method in 5.5.5.8 for
exponential model) . 32
Figure 5 – Determination of working voltage (referring to method in 5.5.5.8 for non-
linear model) . 33
Figure 6 – Isolation capacitance measurement circuit . 36
Figure 7 – Isolation resistance measurement circuit . 37
Figure 8 – Isolation voltage measurement circuit . 38
Figure 9 – Partial discharge test circuit . 39
Figure 10 – Connections for the calibration of the complete test arrangement . 40
Figure 11 – Switching time test circuit . 43
Figure 12 – Transition time waveform measurement . 43
Figure 13 – Propagation delay time waveform measurement . 44
Figure 14 – Static versus dynamic data source signal VI . 45
Figure 15 – Common-mode transient immunity (CMTI) test setup for both static and
dynamic testing . 45
Figure 16 – Static common-mode transient immunity (CMTI) and V and low to high
CM
data transition waveform . 47
Figure A.1 – Lifetime verification . 49
Table 1 – Overview on characteristics and symbols . 19
Table 2 – Datasheet characteristics . 21
Table 3 – Tests and test sequence for coupler providing basic insulation and reinforced
insulation for protection against electrical shock . 22
Table 4 – Test conditions . 23
– 4 – IEC 60747-17:2020 © IEC 2020
Table 5 – Safety factor F. 41
Table 6 – Specified conditions for method a and method b. 42
Table A.1 – Front end process changes within component . 49
Table A.2 – Front End Process Changes within SiO/SiN/imide-passivation . 50
Table A.3 – Layout changes . 50
Table A.4 – Backend changes . 50
IEC 60747-17:
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