IEC TR 63304:2021

Methods of measurement of the magnetic properties of permanent magnet (magnetically hard) materials in an open magnetic circuit using a superconducting magnet

IEC TR 63304:2021

Name:IEC TR 63304:2021   Standard name:Methods of measurement of the magnetic properties of permanent magnet (magnetically hard) materials in an open magnetic circuit using a superconducting magnet
Standard number:IEC TR 63304:2021   language:English language
Release Date:25-Apr-2021   technical committee:TC 68 - Magnetic alloys and steels
Drafting committee:WG 5 - TC 68/WG 5   ICS number:17.220.20 - Measurement of electrical and magnetic quantities

IEC TR 63304
Edition 1.0 2021-04
TECHNICAL
REPORT
Methods of measurement of the magnetic properties of permanent magnet
(magnetically hard) materials in an open magnetic circuit using a
superconducting magnet




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IEC TR 63304
Edition 1.0 2021-04
TECHNICAL
REPORT
Methods of measurement of the magnetic properties of permanent magnet

(magnetically hard) materials in an open magnetic circuit using a

superconducting magnet
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 17.220.20; 29.030 ISBN 978-2-8322-9714-8

– 2 – IEC TR 63304:2021 © IEC 2021
CONTENTS
FOREWORD . 5
INTRODUCTION . 7
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
4 General principle . 11
4.1 Principle of the method . 11
4.2 Superconducting magnet (SCM). 12
4.3 Magnetic field strength sensor (H sensor) . 13
4.4 Magnetic dipole moment detection coil (M coil) . 13
4.5 Specimen rod and moving device . 14
4.6 Measuring devices and the data processing device . 14
5 Test specimen . 14
6 Preparation of measurement . 15
6.1 Measurement of volume of the test specimen . 15
6.2 Initial magnetization of the test specimen to saturation . 15
7 Determination of magnetic polarization . 15
7.1 Measurement of the magnetic dipole moment . 15
7.2 Determination of magnetic polarization . 16
8 Measurement of magnetic field . 17
9 Calibration of the magnetic dipole moment detection coil (M coil) . 17
10 Determination of demagnetization curve . 17
11 Demagnetizing field correction . 18
11.1 General . 18
11.2 Method A: Method using a demagnetizing factor determined by the shape of
the test specimen only . 20
11.3 Method B: Method using a demagnetizing factor determined by the shape
and the magnetic susceptibility of the test specimen . 20
11.4 Method C: Method using an inverse analysis considering the spatial
distribution of the self-demagnetizing field strength in the test specimen . 21
12 Determination of principal magnetic properties . 21
12.1 Remanent magnetic polarization J . 21
r
12.2 Maximum energy product (BH) . 22
max
12.3 Coercivity (H and H ) . 22
cJ cB
13 Reproducibility . 22
14 Test report . 22
Annex A (informative) SCM-Magnetometer method . 24
Annex B (informative) Effects of the test specimen dimensions . 26
Annex C (informative) Superconducting magnets (SCMs) . 27
Annex D (informative) Magnetic dipole moment detection coils (M coils) . 29
Annex E (informative/normative) Details of the demagnetizing field correction . 31
E.1 General . 31
E.2 Symbols . 31

E.3 Method using a demagnetizing factor determined by the shape and magnetic
susceptibility of the test specimen (Method B). 32
E.4 Method using an inverse analysis considering the spatial distribution of the
self-demagnetizing field strength in the test specimen (Method C) . 34
Annex F (informative) Result of the international round robin test of magnetic

properties of permanent magnets using the SCM-VSM and SCM-Extraction methods . 39
F.1 General . 39
F.2 Protocol of the RRT . 39
F.3 Result of the RRT . 40
F.4 Reproducibility of the measurements . 43
Bibliography . 45

Figure 1 – Demagnetization curve J(H) . 10
Figure 2 – Schematic diagrams of the test apparatus . 11
Figure 3 – Schematic diagrams of the first order gradiometer coil . 13
Figure 4 – Relationship between magnetic polarization and self-demagnetizing field . 18
Figure 5 – Schematic diagram of the demagnetizing field correction . 19
Figure 6 – Conceptual diagram of the procedure of Method C . 21
Figure A.1 – Schematic diagram of the test apparatus for the SCM-Magnetometer
method . 24
Figure A.2 – Schematic diagrams of the test apparatus for the method in a closed

magnetic circuit in accordance with IEC 60404-5 . 25
Figure B.1 – Effects of test specimen dimensions on magnetic properties [B , H , H
r cJ cB
and (BH) ] for Nd-Fe-B sintered magnets with different coercivities . 26
max
Figure C.1 – Typical cross-sectional structure of the ceramic SCM . 28
Figure D.1 – Schematic diagram of the second order gradiometer coil for the SCM-
VSM method . 29
Figure D.2 – Schematic diagram of the dependence of induced voltage on the position
of the test specimen in the SCM-Extraction method . 30
Figure E.1 – Axes of a cuboid magnet . 32
Figure E.2 – Conceptual diagram of the procedure of Method C. 35
Figure E.3 – Flowchart of the procedure of Method C . 36
Figure E.4 – Comparison of the demagnetization curves corrected using demagnetizing
field correction Methods A, B and C . 38
Figure F.1 – Comparison of J measured by the laboratories . 40
r
Figure F.2 – Comparison of H measured by the laboratories . 41
cJ
Figure F.3 – Comparison of (BH) measured by the laboratories . 41
max
Figure F.4 – Comparison of hysteresis loops measured by the laboratories . 43
Figure F.5 – Relative standard deviation of J , H and (BH) . 44
r cJ max
Table 1 – Features of the demagnetizing field correction methods in comparison with
Method B . 20
Table 2 – Reproducibility of the magnetic properties . 22

– 4 – IEC TR 63304:2021 © IEC 2021
Table C.1 – Performance of SCMs . 27
Table F.1 – Nominal values of coercivity . 39
Table F.2 – Participating laboratories and their employed measuring methods . 40
Table F.3 – Comparison of magnetic properties measured by the laboratories . 42
Table F.4 – Comparison of the reproducibility . 44

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
METHODS OF MEASUREMENT OF THE MAGNETIC PROPERTIES OF
PERMANENT MAGNET (MAGNETICALLY HARD) MATERIALS IN AN OPEN
MAGNETIC CIRCUIT USING A SUPERCONDUCTING MAGNET

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
may participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
Standardization (ISO) in accordance with conditions determined by agreement between the tw
...

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