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SLOVENSKI STANDARD
01-oktober-2018
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Electronic components - Long-term storage of electronic semiconductor devices - Part 4:
Storage (IEC 62435-4:2018)
Ta slovenski standard je istoveten z: EN IEC 62435-4:2018
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 62435-4
NORME EUROPÉENNE
EUROPÄISCHE NORM
August 2018
ICS 31.020
English Version
Electronic components - Long-term storage of electronic
semiconductor devices - Part 4: Storage
(IEC 62435-4:2018)
Composants électroniques - Stockage de longue durée des Elektronische Bauteile - Langzeitlagerung elektronischer
dispositifs électroniques à semiconducteurs - Part 4: Halbleiterbauelemente - Teil 4: Lagerung
Stockage (IEC 62435-4:2018)
(IEC 62435-4:2018)
This European Standard was approved by CENELEC on 2018-07-10. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 62435-4:2018 E
European foreword
The text of document 47/2469/FDIS, future edition 1 of IEC 62435-4, prepared by IEC/TC 47
"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN IEC 62435-4:2018.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2019-04-10
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2021-07-10
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62435-4:2018 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60068-2-17 NOTE Harmonized as EN 60068-2-17
IEC 60721-3-1 NOTE Harmonized as EN IEC 60721-3-1
IEC 60749-30 NOTE Harmonized as EN 60749-30
IEC 61340-5-1 NOTE Harmonized as EN 61340-5-1
IEC 61340-5-3 NOTE Harmonized as EN 61340-5-3
IEC 61760-2 NOTE Harmonized as EN 61760-2
IEC 62258 series NOTE Harmonized as EN 62258 series
IEC 62435 series NOTE Harmonized as EN 62435 series
IEC 62435-2 NOTE Harmonized as EN 62435-2
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is
available here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60749-20-1 - Semiconductor devices - Mechanical and EN 60749-20-1 -
climatic test methods - Part 20-1: Handling,
packing, labelling and shipping of surface-
mount devices sensitive to the combined
effect of moisture and soldering heat
IEC/TR 61340-5-2 - Electrostatics -- Part 5-2: Protection of CLC/TR 61340-5-2 -
electronic devices from electrostatic
phenomena - User guide
IEC/TR 62258-3 - Semiconductor die products -- Part 3: - -
Recommendations for good practice in
handling, packing and storage
JEDEC J-STD-033 - Standard for handling, packing, shipping,
and use of moisture/reflow sensitive
surface mount devices
MIL-PRF-27401 - Propellant pressurizing agent nitrogen
MIL-PRF-81705 - ESD Materials, Bags and Performance
Specification
IEC 62435-4
Edition 1.0 2018-06
INTERNATIONAL
STANDARD
Electronic components – Long-term storage of electronic semiconductor
devices –
Part 4: Storage
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.020 ISBN 978-2-8322-5768-5
– 2 – IEC 62435-4:2018 © IEC 2018
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 8
2 Normative references . 8
3 Terms and definitions . 8
4 Purpose of storage (facility) . 10
4.1 General . 10
4.2 Cost of ownership . 10
4.3 Security . 10
4.4 Location and ambient environment . 10
4.5 Incorrect control of reliability during storage . 10
5 Storage . 10
5.1 General . 10
5.2 Type of environment . 11
5.3 Storage identification – traceability . 11
5.4 Initial packaging . 11
5.5 Storage conditions . 12
5.5.1 General . 12
5.5.2 Storage area . 12
5.6 Maintaining storage conditions . 13
6 Periodic check of the components . 13
6.1 Objectives . 13
6.2 Periodicity . 13
6.3 Tests during periodic check . 14
7 Removal from storage . 14
7.1 Precautions . 14
7.2 Electrostatic discharges . 14
8 Materials used in storage regimes . 14
8.1 General . 14
8.2 Moisture barrier bags (MBB) . 14
8.3 Desiccant . 15
8.4 Humidity indicator card (HIC) . 15
8.5 Dry nitrogen atmosphere . 15
8.6 High purity dry air atmosphere . 15
8.7 Storage containers . 16
8.8 Foams, packing material and protective cushioning . 16
9 General storage environment . 16
10 LTS methods . 16
10.1 General . 16
10.2 Dry cabinet storage . 17
10.2.1 General . 17
10.2.2 Humidity controlled storage . 17
10.2.3 Oxygen (O )-controlled storage . 17
10.2.4 Outgassing-controlled storage . 17
10.3 MBB storage . 17
10.3.1 General . 17
IEC 62435-4:2018 © IEC 2018 – 3 –
10.3.2 Humidity-controlled storage . 17
10.3.3 Oxygen (O )-voided storage . 17
10.3.4 Outgassing controlled storage . 18
10.3.5 Nitrogen (N ) positive-pressure MBB storage . 18
11 LTS double containment redundancy . 18
Annex A (normative) Example checklist for long-term storage facilities . 19
Bibliography . 20
Table A.1 – Example checklist for storage facilities . 19
– 4 – IEC 62435-4:2018 © IEC 2018
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ELECTRONIC COMPONENTS – LONG-TERM STORAGE
OF ELECTRONIC SEMICONDUCTOR DEVICES –
Part 4: Storage
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2)
...